The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 2016
Filed:
May. 16, 2013
Thin film transistor substrate, method of inspecting the same, and display device including the same
Samsung Display Co., Ltd., Yongin-city, KR;
Sungin Ro, Hwaseong-si, KR;
Hyangyul Kim, Hwaseong-si, KR;
Seunghyun Park, Seoul, KR;
Jaehak Lee, Suwon-si, KR;
Samsung Display Co., Ltd., Yongin-si, KR;
Abstract
A thin film transistor substrate, includes: pixels disposed in a display area of the thin film transistor substrate and connected to gate lines and data lines; gate pad parts connected to first ends of the gate lines; first test transistors each being connected to a second end of a corresponding gate line of the gate lines; data pad parts connected to first ends of the data lines; and second test transistors each being connected to a second end of a corresponding data line of the data lines. The gate pad parts, the data pad parts, the first test transistors, and the second test transistors are disposed in a non-display area of the thin film transistor substrate. The first test transistors are configured to be switched to receive a first inspection signal and the second test transistors are configured to be switched to receive a second inspection signal.