The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 2016
Filed:
Jun. 15, 2012
Myra A. Torres, Pittsford, NY (US);
Abhijit Bhoite, Boise, ID (US);
Nikhil Beke, Wheeling, IL (US);
Kevin Patrick Mccormick, Auburn, NY (US);
Timothy Duffy, West Henrietta, NY (US);
Jeremy W. Sheaffer, Pittsford, NY (US);
Maksim Bobrov, Rochester, NY (US);
Michael Moore, Rochester, NY (US);
Myra A. Torres, Pittsford, NY (US);
Abhijit Bhoite, Boise, ID (US);
Nikhil Beke, Wheeling, IL (US);
Kevin Patrick McCormick, Auburn, NY (US);
Timothy Duffy, West Henrietta, NY (US);
Jeremy W. Sheaffer, Pittsford, NY (US);
Maksim Bobrov, Rochester, NY (US);
Michael Moore, Rochester, NY (US);
SIKORSKY AIRCRAFT CORPORATION, Stratford, CT (US);
Abstract
An inspection apparatus includes an imaging unit producing image signals; a processing unit for receiving the image signal; the imaging unit producing a stack of images of an article at different focal lengths in response to the processing unit; the processing unit generating a depth map from the stack of images; the processing unit analyzing the depth map to derive a depth profile of an object of interest; the processing unit determining a surface mean for the article from the stack of images; and the processing unit characterizing the article as degraded or contaminated in response to the depth profile and the surface mean.