The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 2016

Filed:

Dec. 31, 2014
Applicant:

Microsoft Corporation, Redmond, WA (US);

Inventors:

Stephen Lin, Beijing, CN;

Baining Guo, Beijing, CN;

Changyin Zhou, San Jose, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/40 (2006.01); G06T 5/00 (2006.01); H04N 1/409 (2006.01); H04N 5/217 (2011.01);
U.S. Cl.
CPC ...
G06T 5/005 (2013.01); H04N 1/409 (2013.01); H04N 5/2171 (2013.01); H04N 5/2178 (2013.01); G06T 2207/10004 (2013.01); G06T 2207/20021 (2013.01); G06T 2207/20182 (2013.01);
Abstract

Removal of the effects of dust or other impurities on image data is described. In one example, a model of artifact formation from sensor dust is determined. From the model of artifact formation, contextual information in the image and a color consistency constraint may be applied on the dust to remove the dust artifacts. Artifacts may also be removed from multiple images from the same or different cameras or camera settings.


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