The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 2016
Filed:
Nov. 01, 2013
National Cheng Kung University, Tainan, TW;
Haw-Ching Yang, Tainan, TW;
Hao Tieng, Tainan, TW;
Min-Hsiung Hung, Taoyuan Hsien, TW;
Fan-Tien Cheng, Tainan, TW;
NATIONAL CHENG KUNG UNIVERSITY, Tainan, TW;
Abstract
A virtual metrology based method for predicting machining quality of a machine tool is provided. In this method, each product accuracy item is correlated with operation paths of the machine tool. During a modeling stage, the machine tool is operated to process workpiece samples, and sample sensing data of the workpiece samples associated with the operation paths are collected during the operation of the machine tool. The sample sensing data of each workpiece sample is de-noised and converted into the sample feature data corresponding to each feature type. The workpiece samples are measured with respect to the product accuracy item and integrated into the feature data for building a predictive model, thereby obtaining quality predicted data for each product accuracy item. During a usage stage, accuracy item values of a workpiece are predicted using the feature data during processing the workpiece in accordance with the predictive models.