The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 2016

Filed:

Nov. 24, 2014
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Kumar Arrakutti Desappan, Karnataka, IN;

Manu Mathew, Karnataka, IN;

Pramod Kumar Swami, Karnataka, IN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/46 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06K 9/4647 (2013.01); G06K 9/4652 (2013.01); G06K 9/6212 (2013.01);
Abstract

An object detection system and a method of detecting an object in an image are disclosed. In an embodiment, a method for detecting the object includes computing one or more feature planes of one or more types for each image pixel of the image. A plurality of cells is defined in the image, where each cell includes first through nnumber of pixels, and starting locations of each cell in the image in horizontal and vertical directions are integral multiples of predefined horizontal and vertical step sizes, respectively. One or more feature plane summations of one or more types are computed for each cell. A feature vector is determined for an image portion of the image based on a set of feature plane summations, and the feature vector is compared with a corresponding object classifier to detect a presence of the corresponding object in the image portion of the image.


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