The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 2016
Filed:
Sep. 30, 2014
Tencent Technology (Shenzhen) Company Limited, Guangdong, CN;
Xiongbing Deng, Guangdong, CN;
Zishun Chen, Guangdong, CN;
TENCENT TECHNOLOGY (SHENZHEN) COMPANY LIMITED, Guangdong, CN;
Abstract
A method for closure testing is disclosed. The method includes: acquiring an identification of a closure to be tested; generating code to be inserted based on the identification of the closure to be tested; searching and obtaining a corresponding annotation based on the identification of the closure to be tested, and determining a closure corresponding to the identification of the closure to be tested based on the annotation; adding the generated code to be inserted to the searched closure; and testing the closure added the code to be inserted. In addition, the present disclosure also discloses a device for closure testing. For the above method and device for closure testing, it reduces the burden of the tester and improves testing efficiency, and the source code published to the network need not to make an internal interface in a closure be exposed for testing, which improves the security of the program.