The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 2016

Filed:

Jun. 30, 2011
Applicants:

Florent Miller, Courbevoie, FR;

Sebastien Morand, Boulogne Billancourt, FR;

Inventors:

Florent Miller, Courbevoie, FR;

Sebastien Morand, Boulogne Billancourt, FR;

Assignee:

AIRBUS GROUP SAS, Paris, FR;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 13/38 (2006.01); G01R 31/00 (2006.01); G01R 31/28 (2006.01); G01B 1/00 (2006.01); H01L 21/00 (2006.01); G01R 31/311 (2006.01); G01R 31/3181 (2006.01);
U.S. Cl.
CPC ...
G01R 31/002 (2013.01); G01R 31/2848 (2013.01); G01R 31/2849 (2013.01); G01R 31/2881 (2013.01); G01B 1/00 (2013.01); G01R 31/311 (2013.01); G01R 31/31816 (2013.01); H01L 21/00 (2013.01); H01L 2221/00 (2013.01);
Abstract

A method for characterizing the sensitivity of an electronic component with respect to a natural radiating environment. The safe operating area (SOA) voltage range beyond which destructive events occur is determined for the electronic component for given characteristics of a particle or incident beam. The electronic component is turned on and energized with the particle or incident beam having the given characteristics under the operating conditions that are close to the highest voltage value of the determined SOA voltage range. An efficient section of amplified transient events, which corresponds to an estimation of the destructive occurrences for the electronic component is determined. The characteristics of the particle or beam is modified and the method is repeated with the modified characteristics.


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