The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 2016

Filed:

Feb. 23, 2015
Applicant:

Yale University, New Haven, CT (US);

Inventors:

Rong Fan, Cheshire, CT (US);

Yao Lu, New Haven, CT (US);

Jonathan Chen, San Jose, CA (US);

Assignee:

Yale University, New Haven, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/543 (2006.01);
U.S. Cl.
CPC ...
G01N 33/54306 (2013.01); G01N 33/54366 (2013.01); G01N 33/54386 (2013.01); G01N 2570/00 (2013.01); G01N 2800/7028 (2013.01);
Abstract

The present invention relates to a system, device, and method for the high throughput multiplexed detection of a wide number of compounds. The invention comprises of a microwell array coupled to a capture agent array to form a plurality of interfaces between a microwell and a set of immobilized capture agents. The set of capture agents comprises a plurality of distinguishable features, with each feature corresponding to the detection of a particular compound of interest. In certain embodiments, each microwell is configured to contain a single cell. The invention is therefore capable of performing a high throughput analysis of single cell profiles, including profiles of secreted compounds.


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