The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 2016
Filed:
Oct. 02, 2014
The Boeing Company, Chicago, IL (US);
Roger W. Engelbart, St. Louis, MO (US);
Taisia Tsukruk Lou, St. Louis, MO (US);
The Boeing Company, Chicago, IL (US);
Abstract
A method and system are provided for non-destructively evaluating a workpiece hidden by an overlying structure. In the context of a method, a workpiece is interrogated with radiation, such as x-ray radiation, that also propagates through the overlying structure. The method further includes collecting data representative of radiation backscattered from the workpiece. Based upon a thickness and material of the overlying structure, the method compares the data that has been collected from the workpiece with reference data representative of radiation backscattered from a standard that includes different respective material loss indicators hidden by an overlying structure of the same thickness and material. Each material loss indicator is a physical representation of a different amount of material loss. As a result of the comparison, the method estimates the material loss of the workpiece.