The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 2016

Filed:

Feb. 04, 2013
Applicants:

University of Cincinnati, Cincinnati, OH (US);

The United States of America As Represented BY the Secretary of the Air Force, Washington, DC (US);

Inventors:

Ian Papautsky, Mason, OH (US);

Li Shen, Cincinnati, OH (US);

Joshua Hagen, Cincinnati, OH (US);

Morley Stone, Spring Valley, OH (US);

Assignee:

University Of Cincinnati, Cincinnati, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/25 (2006.01); G01J 3/46 (2006.01); G01N 21/27 (2006.01); G01N 21/78 (2006.01); G01N 21/29 (2006.01);
U.S. Cl.
CPC ...
G01N 21/25 (2013.01); G01J 3/46 (2013.01); G01N 21/278 (2013.01); G01N 21/78 (2013.01); G01N 21/293 (2013.01); G01N 2201/061 (2013.01); G01N 2201/127 (2013.01); G01N 2201/13 (2013.01);
Abstract

Described herein is a method, system and computer program for analyzing a colorimetric assay that includes obtaining an image of the assay, optionally correcting for ambient lighting conditions in the image, converting the intensity data for at least one of the red channel, the green channel, or the blue channel to a first data point, recalling a predetermined standardized curve, comparing the first data point with the standardized curve, and identifying the value for the assay parameter from the standardized curve.


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