The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 2016
Filed:
Nov. 15, 2011
Matthew W. Bellis, Lexington, KY (US);
Daniel L. Lau, Lexington, KY (US);
Matthew W. Bellis, Lexington, KY (US);
Daniel L. Lau, Lexington, KY (US);
Seikowave, Inc., Lexington, KY (US);
Abstract
A surface measurement module for 3-D triangulation-based image acquisition of a surface-under-inspection and under observation by at least one camera. The module having: (a) a casing housing an optical system comprising a plurality of lens elements positioned between a fixed-pattern optic and a light source; (b) an output of said fixed-pattern optic comprising a multi-frequency pattern comprising a plurality of pixels representing at least a first and second superimposed sinusoid projected simultaneously, each of the sinusoids represented by the pixels having a unique temporal frequency and each of the pixels projected to satisfy (c) a shifting element to spatially shift said output of said fixed-pattern optic during projection onto the surface-under-inspection; and (d) a plurality of images captured of said output of said fixed-pattern optic during projection onto the surface-under-inspection are used for the image acquisition.