The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 2016
Filed:
Oct. 12, 2012
Nireco Corporation, Hachioji, JP;
Yoshitaka Ohta, Hachioji, JP;
Nireco Corporation, Hachioji, JP;
Abstract
The purpose of the present invention is to not only decrease the time required to detect an optical section line in an optical sectioning method but to improve precision in shape measurement of an object to be measured. In this shape measuring method, after an area dividing line is drawn in a region that includes an extracted optical section line and the region is divided into small areas, a longitudinal region is established that spreads in the up and down direction by a plurality of pixels centered around the location of the optical section line in each small area. The next image processing occurs in the whole region of the longitudinal regions.