The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 2016

Filed:

Apr. 21, 2014
Applicant:

Pruftechnik Dieter Busch Ag, Ismaning, DE;

Inventor:

Roland Holzl, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/14 (2006.01); H04N 5/225 (2006.01); G01B 11/27 (2006.01);
U.S. Cl.
CPC ...
G01B 11/14 (2013.01); G01B 11/272 (2013.01); H04N 5/2253 (2013.01); H04N 5/2254 (2013.01);
Abstract

The invention relates to a device for determining the location of a first mechanical element () and a second mechanical element () with respect to each other, having a first measurement unit () for positioning at the first mechanical element, a second measurement unit () for positioning at the second mechanical element, and an analysis unit (), wherein the first measurement unit has means () for producing at least one light beam bundle (), a scattering surface () for scattering the light (WV, PV) impinging on the scattering surface, and a camera () for recording images of the scattering surface, wherein the second measurement unit has a reflector arrangement (), which faces the first measurement unit when the measurement units are positioned at the respective mechanical element so as to reflect the light beam bundle () onto the scattering surface.


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