The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 2016
Filed:
Dec. 21, 2013
Magiq Technologies, Inc, Somerville, MA (US);
Caleb A Christensen, Somerville, MA (US);
Anton Zavriyev, Swampscott, MA (US);
A. Craig Beal, Stoneham, MA (US);
MagiQ Technologies, Inc., Somerville, MA (US);
Abstract
A method determines a distance with a specified accuracy. The method transmits to an interferometer a test signal oscillating with a test frequency and receives, in response to the transmitting, an interferometric signal formed by interfering the test signal with a delayed signal produced by delaying a copy of the test signal over the distance equal to a path length difference in the interferometer. The test frequency is varying such that the test signal oscillates with different values of the test frequency. The method determines at least two values of the test frequency corresponding to particular values of the interferometric signal by beating the test signal with a reference signal having a reference frequency, wherein a value of the reference frequency is an absolute value predetermined with the specified accuracy. The method determines the distance using the two values of the test frequency.