The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2016

Filed:

Dec. 22, 2014
Applicant:

The Boeing Company, Chicago, IL (US);

Inventors:

Ying J. Feria, Manhattan Beach, CA (US);

John M. Sullivan, Manhattan Beach, CA (US);

Greg Busche, Rancho Palos Verdes, CA (US);

Murat E. Veysoglu, Cypress, CA (US);

Lori Shima, Manhattan Beach, CA (US);

Assignee:

The Boeing Company, Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 40/00 (2009.01); H04W 16/24 (2009.01); H04W 16/02 (2009.01); H04B 7/204 (2006.01); H04W 16/28 (2009.01);
U.S. Cl.
CPC ...
H04W 16/24 (2013.01); H04B 7/2041 (2013.01); H04W 16/02 (2013.01); H04W 16/28 (2013.01);
Abstract

A system is provided for overlapping cells for wireless coverage in a cellular communication system. The system includes a beam-weight generator and beamformer coupled to the beam-weight generator. The beam-weight generator is configured to generate a plurality of beam weights including at least first and second sets of beam weights. And the beamformer is configured to apply the first and second sets of beam weights to signals in a cellular communication system. The cellular communication system provides coverage over a geographic region divided into cells arranged in overlapping first and second layers of cells having criteria optimized for respective, distinct first and second types of services, or communication by respective, distinct first and second types of user terminals. In this regard, the criteria are reflected in the first and second sets of beam weights.


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