The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2016

Filed:

Nov. 22, 2013
Applicant:

Palantir Technologies, Inc., Palo Alto, CA (US);

Inventors:

Matthew Sprague, Santa Monica, CA (US);

Miklos Danka, London, GB;

Bill Dwyer, Palo Alto, CA (US);

Assignee:

Palantir Technologies Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04M 11/04 (2006.01); H04W 4/02 (2009.01); H04W 12/02 (2009.01); H04L 29/08 (2006.01);
U.S. Cl.
CPC ...
H04W 4/02 (2013.01); H04W 12/02 (2013.01); H04L 67/22 (2013.01);
Abstract

Systems and methods are disclosed for collocation detection. In accordance with one implementation, a method is provided for collocation detection. The method includes obtaining a first object observation that includes a first object identifier, a first observation time, and a first observation location. The method also includes obtaining a second object observation that includes a second object identifier, a second observation time, and a second observation location. In addition, the method includes associating the first observation with a first area on a map, associating the second observation with a second area on the map, and determining whether a potential meeting occurred between objects associated with the first object identifier and the second object identifier based on the first and second observation times, and the first and second areas.


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