The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2016

Filed:

Nov. 29, 2012
Applicant:

Amazon Technologies, Inc., Reno, NV (US);

Inventors:

Sharadh Ramaswamy, Sunnyvale, CA (US);

Volodymyr V. Ivanchenko, Mountain View, CA (US);

Assignee:

Amazon Technologies, Inc., Reno, NV (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 13/02 (2006.01); H04N 7/00 (2011.01);
U.S. Cl.
CPC ...
H04N 7/00 (2013.01); H04N 13/02 (2013.01);
Abstract

The quality of stereoscopic imaging using cameras with wide angle lenses can be improved using various calibration approaches to determine distortions or misalignments between the cameras. A calibration object such as a checkered grid with a determined inclination between portions can be used to provide lateral calibration as well as depth information. Intersections of the checkered regions can be used to determine intersection points for the calibration object in the image. Regions about at least a portion of these points can be analyzed, where the regions are sized such that features of the calibration object are substantially linear. Nearest neighbor points can be identified, and a local orientation determined in order to determine a relationship of each of the nearest points. Once identified, the points in each image can be correlated to corresponding points of the calibration object.


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