The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2016

Filed:

Mar. 25, 2016
Applicant:

Olympus Corporation, Hachioji-shi, Tokyo, JP;

Inventors:

Atsuro Okazawa, Hino, JP;

Teruaki Yamasaki, Hino, JP;

Takeshi Fukutomi, Hachioji, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G03B 13/00 (2006.01); H04N 5/232 (2006.01); H04N 5/228 (2006.01); H04N 5/369 (2011.01);
U.S. Cl.
CPC ...
H04N 5/3696 (2013.01); H04N 5/23212 (2013.01); H04N 5/23229 (2013.01);
Abstract

An imaging apparatus includes a high-frequency pattern detector calculating a difference or a ratio between a value obtained by integrating averages of pixel outputs of a first pixel group arranged in identical positions in a vertical direction with respect to a focus detection pixel or in identical positions in a vertical direction with respect to another focus detection pixel located around the focus detection pixel and a value obtained by integrating averages of pixel outputs of a second pixel group arranged in positions shifted from the first pixel group in the horizontal or vertical direction, and sets a high-frequency degree in accordance with a magnitude of the difference or the ratio. An application determination unit increases the mixing rate of the focus detection pixel when the high-frequency pattern degree is high.


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