The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2016
Filed:
Nov. 26, 2013
Raytheon Company, Waltham, MA (US);
Andrew M. Kowalevicz, Arlington, VA (US);
Frank Allen Birdsong, Jr., Alexandria, VA (US);
RAYTHEON COMPANY, Waltham, MA (US);
Abstract
Imaging systems and methods for simultaneous real and Fourier plane imaging. In one example, an imaging system includes at least one optical element configured to receive and focus incident electromagnetic radiation from a viewed scene, a first detector positioned at an image plane of the at least one optical element and configured to produce a first image of the viewed scene, and a second detector positioned at a Fourier plane of the at least one optical element and configured to produce a second image of the viewed scene, the first and second detectors configured to receive the electromagnetic radiation and produce the first and second images, respectively. The system may additionally include an optical component, such as a beamsplitter, for example, configured to divide and direct the incident electromagnetic radiation to the first and second detectors.