The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2016
Filed:
Jan. 27, 2012
Scott Blanchard, New York, NY (US);
Daniel Terry, New York, NY (US);
James Munro, New Haven, CT (US);
Peter Geggier, New York, NY (US);
Scott Blanchard, New York, NY (US);
Daniel Terry, New York, NY (US);
James Munro, New Haven, CT (US);
Peter Geggier, New York, NY (US);
CORNELL UNIVERSITY, Ithaca, NY (US);
Abstract
Automatically selecting time traces from a fluorescence experiment, in one aspect, may include capturing results of the fluorescence experiment in a moving image; localizing sources of fluorescence in the moving image; producing time traces of each fluorescent source by monitoring fluorescence intensity of said localized sources in the moving image over time; removing unuseful time traces from said produced time traces; and selecting useful time traces from said produced time traces based on one or more defined criteria. FRET traces from selected time traces may be further calculated and analyzed. A unified computer-implemented platform in one aspect may include tools to locate single molecules, extract traces, classify smFRET traces according to adjustable parameters, and quantify the kinetic parameters of FRET transitions using analytical procedures such as Hidden Markov Modeling (HMM) procedures.