The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2016

Filed:

Aug. 10, 2015
Applicant:

Mitsubishi Electric Research Laboratories, Inc., Cambridge, MA (US);

Inventors:

Petros T Boufounos, Arlington, MA (US);

Diego Valsesia, Borgomanero, IT;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/48 (2006.01); G06K 9/36 (2006.01); H04N 19/103 (2014.01); H04N 19/154 (2014.01); H04N 19/172 (2014.01); H04N 19/136 (2014.01); H04N 19/61 (2014.01); G06T 1/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/481 (2013.01); G06K 9/36 (2013.01); G06T 1/0007 (2013.01); H04N 19/103 (2014.11); H04N 19/136 (2014.11); H04N 19/154 (2014.11); H04N 19/172 (2014.11); H04N 19/61 (2014.11); G06T 2207/10036 (2013.01); G06T 2207/10044 (2013.01);
Abstract

A method reconstructs and an uncompressed signal by first obtaining an encoded signal corresponding to the uncompressed signal, wherein the encoded signal includes universally quantized dithered linear measurements of the signal, and wherein each universally quantized dithered linear measurement is a quantized dithered linear measurement of the signal missing one or more significant bits. Side information about the signal is obtained, and the side information is used to obtain a prediction of the signal. The missing one or more significant bits are determined from the encoded signal using the prediction of the signal and the missing one or more significant bits are combined with the encoded signal to produce quantized dithered linear measurements of the signal. Then, the signal can be reconstructed as a reconstructed signal using the quantized dithered linear measurements.


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