The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2016

Filed:

Oct. 12, 2012
Applicant:

Omron Corporation, Kyoto-shi, Kyoto, JP;

Inventors:

Ambrish Tyagi, Palo Alto, CA (US);

John Drinkard, Fremont, CA (US);

Yoshiharu Tani, Kusatsu, JP;

Koichi Kinoshita, Kyoto, JP;

Assignee:

Omron Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); F16P 3/14 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00369 (2013.01); F16P 3/144 (2013.01); G06T 7/0022 (2013.01);
Abstract

According to one aspect of the teachings presented herein, a projective volume monitoring apparatus is configured to detect objects intruding into a monitoring zone. The projective volume monitoring apparatus is configured to detect the intrusion of objects of a minimum object size relative to a protection boundary, based on an advantageous processing technique that represents range pixels obtained from stereo correlation processing in spherical coordinates and maps those range pixels to a two-dimensional histogram that is defined over the projective coordinate space associated with capturing the stereo images used in correlation processing. The histogram quantizes the horizontal and vertical solid angle ranges of the projective coordinate space into a grid of cells. The apparatus flags range pixels that are within the protection boundary and accumulates them into corresponding cells of the histogram, and then performs clustering on the histogram cells to detect object intrusions.


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