The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2016

Filed:

May. 16, 2012
Applicants:

Yan-song Zhang, Beijing, CN;

Shan Wang, Beijing, CN;

Inventors:

Yan-Song Zhang, Beijing, CN;

Shan Wang, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30592 (2013.01);
Abstract

An OLAP query processing method oriented to a database and Hadoop hybrid platform is described. When OLAP query processing is performed, the processing is executed first on a main working copy, and a query processing result is recorded in an aggregate result table of a local database; when a working node is faulty, node information of a fault-tolerant copy corresponding to the main working copy is searched for through namenode, and a MapReduce task is invoked to complete the OLAP query processing task on the fault-tolerant copy. The database technology and the Hadoop technology are combined, and the storage performance of the database and the high expandability and high availability of the Hadoop are combined; the database query processing and the MapReduce query processing are integrated in a loosely-coupled mode, thereby ensuring the high query processing performance, and ensuring the high fault-tolerance performance.


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