The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2016
Filed:
Aug. 04, 2014
Ron Dupey, La Crosse, WI (US);
Prasanthi Thatavarthy, La Crosse, WI (US);
Jeff Woody, La Crosse, WI (US);
Ron Dupey, La Crosse, WI (US);
Prasanthi Thatavarthy, La Crosse, WI (US);
Jeff Woody, La Crosse, WI (US);
SAP SE, Walldorf, DE;
Abstract
Technical solutions for detection potential data quality problems are provided. In some implementations, a method includes: automatically without human intervention, identifying a subset of side effect data associated with a set of enterprise data. The side effect data include a plurality of data fields. The method further includes: selecting a first set of data quality detection rules in accordance with a first data field in the plurality of data fields; identifying one or more candidate data quality problems in the set of side effect data by comparing the set of side effect data to the first set of data quality detection rules; and responsive to identifying the one or more candidate data quality problems: causing to be displayed to a user: information representing the one or more candidate data quality problems; and one or more candidate solutions for correcting the one or more candidate data quality problems.