The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2016

Filed:

Sep. 02, 2014
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Leonardo F. Demo, Sao Paulo, BR;

Mariana R. Franco, Sao Paulo, BR;

Denilson Nastacio, Durham, NC (US);

Fabio Negrello, Sao Paulo, BR;

Cassandro J. D. P. Pereira, Sao Paulo, BR;

Maristela Salvatore, Sao Paulo, BR;

Paulo H. O. Sousa Leal, Sao Paulo, BR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30091 (2013.01); G06F 17/30283 (2013.01); G06F 17/30557 (2013.01);
Abstract

A method that includes a first record that relates to a first subject entity is received and a second record that relates to a second subject entity is received, where it is unknown whether the first subject entity is the same as the second subject entity. A comparison of a first external/non-key attribute value for the first subject entity to a second external/non-key attribute value for the second subject entity is performed. A probability value is calculated, at least in part, on a first external/non-key attribute value for the first subject entity to a second external/non-key attribute value for the second subject entity.


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