The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2016

Filed:

Jun. 29, 2011
Applicant:

Masayuki Miyamoto, Osaka, JP;

Inventor:

Masayuki Miyamoto, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 25/00 (2006.01); G01R 15/00 (2006.01); G01R 19/00 (2006.01); G06F 17/16 (2006.01); G06F 3/041 (2006.01); G06F 3/044 (2006.01); G06F 17/12 (2006.01);
U.S. Cl.
CPC ...
G06F 17/16 (2013.01); G06F 3/044 (2013.01); G06F 3/0416 (2013.01); G06F 17/12 (2013.01);
Abstract

A capacitance detecting method disclosed herein, which achieves a good detection accuracy, a good resolution, and a high-speed operation, (A)(a) drives, on the basis of code sequences (di (=di, . . . , diN, where i=1, . . . , M)) which are orthogonal to one another, drive lines (DL, . . . , DLM) in parallel for each of (I) a first capacitance column (Ci) between the drive lines and a first sense line (SL) and (II) a second capacitance column (Ci) between the drive lines and a second sense line (SL) and (b) outputs (sFirst=(s, . . . , sN)) from the column (Ci) and outputs (sSecond=(s, . . . , sN)) from the column (Ci), and (B) estimates (a) on the basis of inner product operation of the outputs (sFirst) and the code sequences (di), a first capacitance value in the column (Ci) and (b) on the basis of inner product operation of the outputs (sSecond) and the code sequences (di), a second capacitance value in the column (Ci).


Find Patent Forward Citations

Miyamoto, Masayuki. (2016). Linear system coefficient estimating method, linear device column value estimating method, capacitance detecting method, integrated circuit, touch sensor system, and electronic device (U.S. Patent No. 9501451). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9501451

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