The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2016
Filed:
Jun. 29, 2011
Masayuki Miyamoto, Osaka, JP;
Masayuki Miyamoto, Osaka, JP;
Sharp Kabushiki Kaisha, Osaka, JP;
Abstract
A capacitance detecting method disclosed herein, which achieves a good detection accuracy, a good resolution, and a high-speed operation, (A)(a) drives, on the basis of code sequences (di (=di, . . . , diN, where i=1, . . . , M)) which are orthogonal to one another, drive lines (DL, . . . , DLM) in parallel for each of (I) a first capacitance column (Ci) between the drive lines and a first sense line (SL) and (II) a second capacitance column (Ci) between the drive lines and a second sense line (SL) and (b) outputs (sFirst=(s, . . . , sN)) from the column (Ci) and outputs (sSecond=(s, . . . , sN)) from the column (Ci), and (B) estimates (a) on the basis of inner product operation of the outputs (sFirst) and the code sequences (di), a first capacitance value in the column (Ci) and (b) on the basis of inner product operation of the outputs (sSecond) and the code sequences (di), a second capacitance value in the column (Ci).