The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2016
Filed:
Dec. 30, 2011
Jonathan R. Peterson, Everett, WA (US);
Cole Wilson, Everett, WA (US);
Thomas Fuller, Seattle, WA (US);
Derek Valleroy, Seattle, WA (US);
Jonathan R. Peterson, Everett, WA (US);
Cole Wilson, Everett, WA (US);
Thomas Fuller, Seattle, WA (US);
Derek Valleroy, Seattle, WA (US);
Cypress Semiconductor Corporation, San Jose, CA (US);
Abstract
A method and apparatus determine a plurality of regions, each of the plurality of regions having a detected change in capacitance value that meets or exceeds a threshold value. In an embodiment, the method and apparatus fit a shape to the plurality of regions and determine another region, the other region being within the fitted shape and not having the detected change in capacitance value that meets or exceeds the threshold value. The method and apparatus may assign an assigned change in capacitance value to the other region.