The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2016
Filed:
Aug. 04, 2015
Canon Kabushiki Kaisha, Tokyo, JP;
Yuichi Tomioka, Utsunomiya, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
An optical scanning apparatus includes a deflector configured to respectively deflect first and second light beams by a first deflection surface and scan first and second scanned surfaces in a main scanning direction, and first and second imaging optical systems configured to respectively collect the first and second light beams deflected by the deflector to the first and second scanned surfaces. The first and second imaging optical systems include a shared multistage lens including first and second optical surfaces arranged in a sub-scanning direction to which each of the first and second light beams enters, the second scanned surface is disposed on a position closer to the deflector than the first scanned surface, and a second optical path length from the first deflection surface to the second scanned surface is longer than a first optical path length from the first deflection surface to the first scanned surface.