The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2016

Filed:

Aug. 28, 2013
Applicant:

Wisconsin Alumni Research Foundation, Madison, WI (US);

Inventors:

Raghuraman Balasubramanian, Madison, WI (US);

Karthikeyan Sankaralingam, Madison, WI (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31725 (2013.01);
Abstract

The prediction of hardware failure is obtained by operating two redundant circuit modules while one circuit module is artificially aged. The output of the two circuit modules is compared and a discrepancy between outputs indicates a projected failure of the aged modules. Aging may be accomplished by one or a combination of lowering operating voltages and re-phasing a sampling clock to reduce slack time both of which provide increased sensitivity to gate delay.


Find Patent Forward Citations

Balasubramanian, Raghuraman. (2016). Integrated circuit providing fault prediction (U.S. Patent No. 9500705). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9500705

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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