The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2016

Filed:

Mar. 11, 2015
Applicant:

Toyota Jidosha Kabushiki Kaisha, Toyota-shi, Aichi-ken, JP;

Inventor:

Yohei Iwahashi, Okazaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2014.01);
U.S. Cl.
CPC ...
G01R 31/26 (2013.01); G01R 31/2608 (2013.01); G01R 31/2621 (2013.01); G01R 31/261 (2013.01);
Abstract

An examination device disclosed herein includes: a power source; an inductor provided between the power source and the semiconductor device; a diode connected in parallel with the inductor, and having an anode connected to a negative side of the inductor and a cathode connected to a positive side of the inductor; and a current cutoff mechanism provided between the power source and the semiconductor device, and configured to cut off an inflow of current to the semiconductor device, wherein the current cutoff mechanism starts to cut off the inflow of the current to the semiconductor device before a timing at which voltage that is applied to the semiconductor device is stabilized, after having experienced a rise to surge voltage, the rise having been triggered by the semiconductor device being turned off, and the current cutoff mechanism completes the cutoff after the timing.


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