The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2016

Filed:

Mar. 02, 2012
Applicants:

Gary J. Waldo, Hillsboro, OR (US);

Kenneth P. Dobyns, Beaverton, OR (US);

Inventors:

Gary J. Waldo, Hillsboro, OR (US);

Kenneth P. Dobyns, Beaverton, OR (US);

Assignee:

TEKTRONIK, INC., Beaverton, OR (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 11/20 (2006.01); G01R 13/02 (2006.01);
U.S. Cl.
CPC ...
G01R 13/0236 (2013.01); G01R 13/029 (2013.01);
Abstract

A test and measurement instrument includes a display having a time domain graticule and a frequency domain graticule. A processor is configured to process an input signal to generate a time domain waveform for display in the time domain graticule, the input signal being correlated to a time base. The processor is also configured to process a second input signal and generate a frequency domain waveform for display in the frequency domain graticule, the second input signal being correlated to the same time base. The frequency domain waveform is correlated to a selected time period of the time base. The processor is also configured to generate a spectrum time indicator configured to graphically illustrate a transform parameter, a location and the selected time period in the time domain graticule with respect to the frequency domain waveform.


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