The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2016

Filed:

Nov. 11, 2014
Applicant:

Genmark Diagnostics, Inc., Carlsbad, CA (US);

Inventors:

Brad Frederick Tieman, Encinitas, CA (US);

Scott Corey, Hydes, MD (US);

Assignee:

GENMARK DIAGNOSTICS, INC., Carlsbad, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); B01L 3/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00732 (2013.01); B01L 3/545 (2013.01); B01L 2300/021 (2013.01); G01N 2035/00752 (2013.01); G01N 2035/00762 (2013.01); G01N 2035/00772 (2013.01); G01N 2035/00782 (2013.01); G01N 2035/00801 (2013.01); G01N 2035/00831 (2013.01); G01N 2035/00851 (2013.01);
Abstract

A sample-containing device configured to be placed into a sample processing instrument for performing a process on a sample contained in the device includes redundant identification features, such as machine-readable tags. A first machine-readable information tag is read before the device is placed in the instrument, and a second machine-readable information tag is read after the device is in the instrument. Information read from the two tags is compared to determine if there is proper correspondence between the information read from the tags to ensure that the correct sample processing device was placed in the instrument.


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