The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2016

Filed:

Aug. 27, 2014
Applicant:

Sysmex Corporation, Kobe-shi, Hyogo, JP;

Inventor:

Shunsuke Ariyoshi, Kobe, JP;

Assignee:

SYSMEX CORPORATION, Kobe-Shi, Hyogo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/02 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00693 (2013.01); G01N 2035/00673 (2013.01); Y10T 436/11 (2015.01);
Abstract

Disclosed is a sample analyzer comprising: a measurement unit including a reagent storage capable of holding a plurality of kinds of reagents, the measurement unit configured to measure a sample by use of a plurality of kinds of reagents held in the reagent storage in combination; a memory in which a calibration curve is stored in association with a reagent set used in creation of the calibration curve; and a controller programmed to perform operations, comprising: in a case where no calibration curve corresponding to a reagent set used in measurement of the sample has been stored, storing, in the memory, information indicating that the reagent set used in the measurement of the sample has been used in measurement, and when creating a calibration curve, automatically extracting the reagent set for which no calibration curve has been stored and for which the information has been stored.


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