The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2016

Filed:

Oct. 08, 2013
Applicant:

Yokogawa Corporation of America, Sugar Land, TX (US);

Inventors:

Frank Douglas Gunther, Fulshear, TX (US);

Klaus Plattner, Sugar Land, TX (US);

Assignee:

Yokogawa Corporation of America, Sugar Land, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 9/36 (2006.01); G01N 9/32 (2006.01); G01F 1/74 (2006.01);
U.S. Cl.
CPC ...
G01N 9/36 (2013.01); G01F 1/74 (2013.01); G01N 9/32 (2013.01);
Abstract

The disclosure generally relates to mass flow meters and more particularly relates to systems and methods for determining, among other things, a volumetric flow of a liquid portion of a multiphase fluid flow. In certain embodiments herein, an expected liquid density of a fluid flow at an operating condition may be determined. Such a determination may include receiving a measured density of the fluid flow and comparing the expected liquid density of the fluid flow to the measured density of the fluid flow. Further, a phase status of the fluid flow may be determined based at least in part on the expected liquid density compared to the measured density of the fluid flow.


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