The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2016

Filed:

Mar. 14, 2013
Applicant:

Kulite Semiconductor Products, Inc., Leonia, NJ (US);

Inventors:

Adam Hurst, Slate Hill, NJ (US);

Joseph R. VanDeWeert, Maywood, NJ (US);

Scott Goodman, Wayne, NJ (US);

Boaz Kochman, New York, NY (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 13/02 (2006.01); G01L 27/00 (2006.01);
U.S. Cl.
CPC ...
G01L 27/005 (2013.01); G01L 13/02 (2013.01); G01L 27/002 (2013.01);
Abstract

A method, device, or system is provided for improving dynamic pressure measurements. In one embodiment, a method comprises receiving, at a filter structure having a restricting tube, an input pressure having a static pressure (P), a lower-frequency dynamic pressure (P) and a higher-frequency dynamic pressure (P); filtering, by the restricting tube, the input pressure to substantially pass an output pressure having the static pressure (P), the lower-frequency dynamic pressure (P), and an attenuated higher-frequency dynamic pressure (P); and outputting, from the filter structure, the output pressure.


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