The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2016
Filed:
Aug. 21, 2012
Ian James Read, Bristol, GB;
Ryan Nichols John, Bristol, GB;
William Neil Macpherson, Scotland, GB;
BAE SYSTEMS plc, London, GB;
Abstract
A method and apparatus for processing measurements of an acoustic wave, the acoustic wave being within a member () made of a composite material and caused by an impact to the member (), the method comprising: analyzing the measurements to detect an initial acoustic wave feature; analyzing the measurements to detect the presence of further acoustic wave features, the further features occurring after the initial feature; if there are no further acoustic wave features, determining that the impact to the member () has not changed the structure of the member (); if there are further features, determining a value of a function of the further acoustic wave features; if the determined value satisfies certain criteria, determining that the impact has changed the structure of the member (); and if the determined value does not satisfy the criteria, determining that the impact has not changed the structure of the member (). By doing so, impact induced damage is detected and quantified by processing separately acoustic data generated by the impact from acoustic data generated by acoustic emission due to damage generation.