The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2016

Filed:

Mar. 14, 2014
Applicant:

University of Connecticut, Farmington, CT (US);

Inventors:

Robert X. Gao, Manchester, CT (US);

Zhaoyan Fan, Willimantic, CT (US);

Jian Cao, Wilmette, IL (US);

Assignee:

University of Connecticut, Framington, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 1/14 (2006.01); G01L 5/00 (2006.01);
U.S. Cl.
CPC ...
G01L 1/146 (2013.01); G01L 5/0076 (2013.01);
Abstract

A method of determining a spatial and temporal pressure distribution profile on an outer surface of a rotating apparatus includes producing one or more pressure indications in response to pressure applied to the outer surface of the rotating apparatus. The producing is carried out by a transducer assembly embedded within the rotating apparatus at a distance d from the outer surface of the rotating apparatus. The method further includes sampling, by an acquisition assembly, the one or more pressure indications from the transducer assembly and storing the sampled one or more pressure indications. The method also includes processing the one or more pressure indications to produce the pressure distribution profile describing the pressure applied to the outer surface.


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