The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2016
Filed:
Jan. 28, 2014
Blum-novotest Gmbh, Gruenkraut-Gullen, DE;
Norbert Moersch, Wangen, DE;
Blum-Novotest GmbH, , DE;
Abstract
The proposed temperature compensation for a measuring probe to be received in a workpiece-processing machine provides a measuring probe, measuring in contacting or non-contacting manner, for registering measured values in respect of a workpiece and for outputting signals that are representative of the measured values, whereby the measuring probe exhibits a probing device for one-dimensional or multi-dimensional probing of a workpiece, at least one probing sensor for converting such probing operations into the representative signals, at least one temperature sensor which has been received in the measuring probe in order to generate a signal that is representative of the temperature of the measuring probe, and a linking device which links the signals of the probing sensor with the signals of the temperature sensor to yield a temperature-compensated probing signal which is intended to be output to a numerical control system of the workpiece-processing machine.