The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2016
Filed:
Jan. 08, 2015
GM Global Technology Operations Llc, Detroit, MI (US);
Sungykyunkwan University Foundation for Corporate Collaboration, Gyeonggi-Do, KR;
Sukhan Lee, Gyeonggi-Do, KR;
Quang-Lam Bui, Gyeonggi-Do, KR;
Jianying Shi, Oakland Township, MI (US);
GM Global Technology Operations LLC, Detroit, MI (US);
SungyKyunKwan University Foundation for Corporate Collaboration, Gyeonggi-Do, KR;
Abstract
A machine vision system including a digital camera can be employed to inspect an object in a field of view. This includes projecting digitally-generated light patterns including first and second boundary patterns and first and second spatial patterns onto the object in the field of view. Images associated with the projected light patterns including the object are captured. Spatial cells are found in the field of view by matching codes in the first and second spatial patterns to boundaries determined based upon one of the first and second boundary patterns. The spatial cells are found in the field of view by matching codes in the spatial patterns to boundaries determined based upon the boundary patterns. The spatial cells are decoded and matched to the boundaries. Three-dimensional (3D) point cloud data of the object is generated based upon the decoded spatial cells matched to the boundaries.