The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2016

Filed:

May. 05, 2015
Applicant:

Electronics and Telecommunications Research Institute, Daejeon, KR;

Inventors:

Soo Hyun Lee, Daejeon, KR;

Je Ho Nam, Daejeon, KR;

Jin Woong Kim, Daejeon, KR;

Kyung Ae Moon, Daejeon, KR;

Eun Young Jang, Daejeon, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/021 (2006.01); G01B 11/02 (2006.01); G03H 1/22 (2006.01);
U.S. Cl.
CPC ...
G01B 11/026 (2013.01); G03H 1/2249 (2013.01); G03H 2001/221 (2013.01); G03H 2001/2247 (2013.01); G03H 2001/2281 (2013.01); G03H 2223/19 (2013.01);
Abstract

An apparatus and a method for measuring quality of a holographic image are disclosed. The apparatus for measuring the quality of the holographic image may include an obtaining unit to obtain a hologram, a reconstruction unit to reconstruct a three-dimensional (3D) holographic image by irradiating the hologram with a light source, a measuring unit to measure depth of the reconstructed holographic image, and an analysis unit to analyze depth representation quality of the holographic image base on the measured depth of the holographic image.


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