The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2016
Filed:
Aug. 24, 2015
Board of Trustees of Michigan State University, East Lansing, MI (US);
Anton S. Khomenko, Lansing, MI (US);
Mahmoodul Haq, Lansing, MI (US);
Gary L. Cloud, East Lansing, MI (US);
BOARD OF TRUSTEES OF MICHIGAN STATE UNIVERSITY, East Lansing, MI (US);
Abstract
A multi-layer transparent composite detection technique includes producing two beams from a single, low-coherence source, a test beam and a reference beam, and scanning the reference beam to determine, with high precision, the depths of flaws (e.g., delaminations, bubbles, inclusions or other reflective or scattering objects) within a specimen or test object. The techniques combine light back-reflected or back-scattered from an internal flaw or interface with light in a reference path to identify such features and locations.