The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2016
Filed:
Jul. 09, 2013
Applicant:
Koninklijke Philips N.v., Eindhoven, NL;
Inventors:
Karl Antonin Bzdusek, Madison, WI (US);
Mark David Wiesmeyer, Fitchburg, WI (US);
Assignee:
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); A61N 5/10 (2006.01); G06T 7/00 (2006.01); G06T 7/20 (2006.01); A61B 6/03 (2006.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
A61N 5/1037 (2013.01); A61B 6/035 (2013.01); A61B 6/469 (2013.01); A61N 5/1031 (2013.01); A61N 5/1071 (2013.01); G06T 7/003 (2013.01); G06T 7/204 (2013.01); A61N 2005/1072 (2013.01); G06T 2207/10081 (2013.01);
Abstract
A method and system for determining a radiation dose transformation error are provided, wherein there is a deformation in one or more imaged structures as recorded by at least one fixed image data set and at least one moving image data set. Corresponding landmark points in the fixed image and in the moving image are automatically or semi-automatically identified.
Bzdusek, Karl. (2016). Dose deformation error calculation method and system (U.S. Patent No. 9498645). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9498645
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile