The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2016

Filed:

May. 07, 2015
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Kriti Sen Sharma, Woburn, MA (US);

Hewei Gao, Pewaukee, WI (US);

Debashish Pal, Milwaukee, WI (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 6/03 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/5258 (2013.01); A61B 6/032 (2013.01); A61B 6/461 (2013.01); A61B 6/482 (2013.01); G06T 11/008 (2013.01); G06T 2207/10081 (2013.01);
Abstract

Various methods and systems for spectral computed tomography imaging are provided. In one embodiment, a method comprises acquiring a first projection dataset and a second projection dataset, detecting a location of metal in the first projection dataset, applying corrections to the first and second projection datasets based on the location of the metal, and displaying an image reconstructed from the corrected first and second projection datasets. In this way, metal artifacts may be substantially reduced in dual or multi-energy CT imaging.


Find Patent Forward Citations

Loading…