The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2016
Filed:
Mar. 23, 2010
Herbert Bruder, Höchstadt, DE;
Thomas Flohr, Uehlfeld, DE;
Rainer Raupach, Heroldsbach, DE;
Martin Sedlmair, Forchheim, DE;
Heinrich Wallschlager, Erlangen, DE;
Herbert Bruder, Höchstadt, DE;
Thomas Flohr, Uehlfeld, DE;
Rainer Raupach, Heroldsbach, DE;
Martin Sedlmair, Forchheim, DE;
Heinrich Wallschlager, Erlangen, DE;
SIEMENS AKTIENGESELLSCHAFT, Munich, DE;
Abstract
A method is disclosed for reconstructing image data of an examination object from measured data, the measured data being captured during a rotating movement of a radiation source of a computed tomography system around the examination object. In at least one embodiment, different iteration images of the examination object are determined successively from the measured data by way of an iterative algorithm, wherein with the iterative algorithm the current iteration image at any one time is high-pass-filtered and weighted as a function of contrast using a variable which contains contrast information relating to the current iteration image at that time.