The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2016

Filed:

Oct. 02, 2013
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventor:

Jürgen Erwin Rahmer, Hamburg, DE;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/05 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0515 (2013.01); G06T 11/008 (2013.01); A61B 2562/0223 (2013.01); A61B 2576/00 (2013.01); G06T 2207/10076 (2013.01); G06T 2207/30004 (2013.01);
Abstract

An apparatus for detecting magnetic particles in a field of view, which apparatus includes selection coils, drive coils, receiving coils configured to acquire detection signals, and a processor configured to control the coils and reconstruct an image of the field of view from the detection signals. The processor is further configured to: identify in the detection signals one or more background time periods at which no magnetic particles were present in the field of view, wherein signal time periods at which magnetic particles were present in the field of view are interspersed with at least one of said one or more background time periods; use the detection signals obtained at the background time periods to correct detection signals obtained at the signal time periods; and reconstruct the image from the corrected detection signals obtained at the signal time periods.


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