The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2016
Filed:
May. 05, 2015
Applicants:
Siemens Medical Solutions Usa, Inc., Malvern, PA (US);
Northwestern University, Evanston, IL (US);
Inventors:
Patrick Magrath, Chicago, IL (US);
Bruce S. Spottiswoode, Chicago, IL (US);
Aurélien Stalder, Erlangen, DE;
Mehmet Akif Gulsun, Princeton, NJ (US);
Michael Markl, Chicago, IL (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 5/0285 (2006.01); G06T 7/00 (2006.01); A61B 5/026 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0285 (2013.01); A61B 5/0263 (2013.01); G06T 7/0012 (2013.01); G06T 7/0016 (2013.01); G06T 7/0083 (2013.01); G06T 2207/10088 (2013.01); G06T 2207/20101 (2013.01); G06T 2207/30104 (2013.01); G06T 2207/30172 (2013.01);
Abstract
Disclosed herein is a framework for facilitating waveform parameter estimation. In accordance with one aspect, time-based waveforms are generated based on analysis planes positioned along a centerline of the vessel. A surface may be fitted to upslope regions of the waveforms to determine one or more waveform parameters based on intersection of the surface with the upslope regions.