The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2016
Filed:
Apr. 05, 2013
Nidek Co., Ltd., Gamagori-shi, Aichi, JP;
Kazunari Shimizu, Toyokawa, JP;
NIDEK CO., LTD., Gamagori-shi, JP;
Abstract
An ophthalmic measurement device to simulate a retinal image of an examinee's eye includes an ocular aberrometer for measuring an aberration of the eye and a calculation control unit for analyzing aberration data obtained by the ocular aberrometer on the naked eye. The calculation control unit calculates subjective correction data intended for a prescription based on a subjective value by obtaining the difference in each meridian direction between a refraction value in the aberration data and a new subjective value of the eye as obtained by a subjective optometry device, obtains a second polynomial equation wherein the coefficient that represents the refraction value among the coefficients of a first polynomial equation used for approximating the aberration data is replaced with a coefficient corresponding to the subjective correction data, back-calculates the aberration data by using the second polynomial equation, and generates a simulation image based on the back-calculated aberration data.