The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2016
Filed:
Jan. 11, 2012
Applicants:
Hiroyuki Ishii, Tokyo, JP;
Daisuke Nishikawa, Tokyo, JP;
Tetsushi Abe, Tokyo, JP;
Inventors:
Assignee:
NTT DOCOMO, INC., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 36/00 (2009.01); H04B 17/318 (2015.01); H04L 5/00 (2006.01); H04W 24/10 (2009.01); H04J 11/00 (2006.01); H04B 17/382 (2015.01);
U.S. Cl.
CPC ...
H04W 36/0094 (2013.01); H04B 17/318 (2015.01); H04J 11/005 (2013.01); H04L 5/0073 (2013.01); H04W 24/10 (2013.01); H04B 17/382 (2015.01); H04L 5/0048 (2013.01); H04L 5/0053 (2013.01);
Abstract
A user equipmentaccording to the present invention is provided with a RSSI measuring unitthat, with regard to a predetermined sub-frame, is configured to measure a radio quality of a serving cell and a neighboring cell for all OFDM symbols within the predetermined sub-frame and that, with regard to sub-frames other than the predetermined sub-frame, is configured to measure the radio quality of the serving cell and the neighboring cell for OFDM symbols containing a reference signal within the sub-frames.