The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 2016

Filed:

May. 02, 2014
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Andrew Ian Russell, San Jose, CA (US);

David Foster Lieb, San Francisco, CA (US);

Andrew Gerritt Huibers, Cupertino, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/02 (2006.01);
U.S. Cl.
CPC ...
H04N 13/0253 (2013.01);
Abstract

An imaging device capable of capturing depth information or surface profiles of objects is disclosed herein. The imaging device uses an enclosed flashing unit to project a sequence of structured light patterns onto an object and captures the light patterns reflected from the surfaces of the object by using an image sensor that is enclosed in the imaging device. The imaging device is capable of capturing an image of an object such that the captured image is comprised of one or more color components of a two-dimensional image of the object and a depth component that specifies the depth information of the object.


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