The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2016
Filed:
Aug. 22, 2014
Applicant:
California Institute of Technology, Pasadena, CA (US);
Inventors:
Xiaoze Ou, Pasadena, CA (US);
Roarke Horstmeyer, San Marino, CA (US);
Guoan Zheng, Vernon, CT (US);
Changhuei Yang, Alhambra, CA (US);
Assignee:
California Institute of Technology, Pasadena, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/02 (2006.01); H04N 5/232 (2006.01); H04N 5/225 (2006.01); H04N 5/32 (2006.01);
U.S. Cl.
CPC ...
H04N 5/23232 (2013.01); H04N 5/2256 (2013.01); H04N 5/32 (2013.01);
Abstract
Certain aspects pertain to Fourier ptychographic imaging systems, devices, and methods such as, for example, high NA Fourier ptychographic imaging systems and reflective-mode NA Fourier ptychographic imaging systems.
Ou, Xiaoze. (2016). Variable-illumination fourier ptychographic imaging devices, systems, and methods (U.S. Patent No. 9497379). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9497379
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile